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Home  >  ADVANCED PACKAGING: 3D IC, WLP & TSV  > TSV solution readies for stacking multiple NAND Flash die m...
  >  ADVANCED PACKAGING: 3D IC, WLP & TSV
Oct 21st, 2008
 
TSV solution readies for stacking multiple NAND Flash die memories
 
SSD capacity is set to grow up to 256GB or above during the 2009-2010 time period according to a recent DRAMExchange expert's analysis. As the capacity requirement continues to grow, makers of these NAND Flash based products will have to face certain bottleneck in packaging technology.
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Wire Bond is limited when stacking multiple dies togethers<br> (Courtesy of Tokyo University, 2008)
Wire Bond is limited when stacking multiple dies togethers
(Courtesy of Tokyo University, 2008)
Primarily applications of NAND Flash such as memory cards, USB drives, and SSD have begun to see rapid growth in memory capacity requirement. Currently, the maximum capacity of SD and CF memory cards is 32GB and 16GB for micro-SD; several vendors have introduced USB drives with 64GB capacity while most SSD products features 32, 64, 80 and 128GB.

Currently, the maximum capacity per single NAND Flash die using 5xnm process is 16Gb (=2GB). However, 16Gb dies using 5xnm process will not fit into micro-SD. we need to wait till 4xnm process technology gets mature. However, regardless of whether vendors use 8 5xnm 8Gb die + 1 control IC to make a 8GB micro-SD or 8 4xnm 16Gb die + 1 control IC to make a 16GB micro-SD, vendors will be looking a very crowded space inside the micro-SD package which will impact yield severely given the limited space to wirebond the dies together. Thus, current COB process for high capacity micro-SD often faces yield issues when attempting to stack multiple dies together.
 
TSOP packages on one PCB of Intel"s SSD
TSOP packages on one PCB of Intel's SSD
Current SSD package technology uses 8, 10, 16 or 20, etc NAND Flash chips in TSOP package on a single PCB with one die per TSOP. Although TSOP can accommodate much bigger die than micro-SD in terms of area, SSD also faces the same challenge as micro-SD as its capacity is limited to the number of dies each TSOP can hold. For example, if the maximum capacity offered in a single TSOP package is 128Gb (=16GB), SSD makers can use 8 TSOP to make a 128GB SSD. If SSD maker wishes to make a 256GB SSD, then 16 128Gb chips are needed. If we want to keep stay with 8 TSOP only, each chip will need to contain 256Gb. Neither is possible unless we can achieve finer geometries on each die or new breakthroughs in how we package stacked dies.

Because of the difficulties involved with further miniaturization from 4x nm onward, in order to continue to increase capacity without being impacted by the difficulties in process advancement, vendors can only turn to breakthroughs in packaging technology such as TSV (Through Silicon Via). TSV is different from conventional wirebond package technology in that it creates vias on the die either by etching or laser, then fill the vias with conducting materials such as copper, polysilicon, tungsten, etc, then finally stack the grinded dies together. TSV is especially advantageous to traditional wirebond because of its shorter signal path, faster data transmission rate, less noise and better performance – all are qualities that contribute to better data transfer between each NAND Flash die and the control IC in memory card application. Currently, major NAND Flash vendors such as Intel, Micron, Samsung, Toshiba, etc have all developed TSV package technology. DRAMexchange experts expect to see TSV to gain wider usage for higher capacity memory cards, USB drives, SSD, etc within the next 3 to 5 years.

 
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